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									| 计算机与控制工程 |  |   |  |  
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    					| 基于改进YOLOv5的电子元件表面缺陷检测算法 |  
						| 曾耀(  ),高法钦*(  ) |  
					| 浙江理工大学 信息科学与工程学院,浙江 杭州 310018 |  
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    					| Surface defect detection algorithm of electronic components based on improved YOLOv5 |  
						| Yao ZENG(  ),Fa-qin GAO*(  ) |  
						| School of Information Science and Engineering, Zhejiang Sci-Tech University, Hangzhou 310018, China |  
					
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 doi: 10.3969/j.issn.1672-6413.2018.04.088
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