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JOURNAL OF ZHEJIANG UNIVERSITY (ENGINEERING SCIENCE)
Automatic Technology, Communication Engineering     
Coverage directed test generation based on genetic algorithm
WANG Shu peng1, HUANG Kai1, YAN Xiao lang2
1. Department of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China;2. Institute of VLSI Design, Zhejiang University, Hangzhou 310027, China
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Abstract  

Coverage directed test generation based on genetic algorithm (GA)was proposed to close the loop between coverage analysis and test generation and produce the tests of good quality. A simple and accurate test encoding method was proposed.  A fitness function based on functional coverage was used to evaluate the quality of tests. GA was used to close the loop between coverage analysis and test generation. The coverage results were evaluated and the constraints for test generation were modified to direct the test generation to produce the new tests, which can cover the functions that the old tests cant cover. The experiments were conducted based on the simulation environment for verifying two high performance 32 bit multi core processors. Results show that the proposed method can significantly reduce simulation time and improve verification efficiency.



Published: 18 September 2016
CLC:  TN 47  
Cite this article:

WANG Shu peng, HUANG Kai, YAN Xiao lang. Coverage directed test generation based on genetic algorithm. JOURNAL OF ZHEJIANG UNIVERSITY (ENGINEERING SCIENCE), 2016, 50(3): 580-588.

URL:

http://www.zjujournals.com/eng/10.3785/j.issn.1008-973X.2016.03.024     OR     http://www.zjujournals.com/eng/Y2016/V50/I3/580


基于遗传算法的覆盖率驱动测试产生器

为了更好地建立覆盖率和测试产生器之间的联系,产生高质量的测试,提出基于遗传算法的覆盖率驱动测试产生器.该测试产生器利用一种简单、准确的测试编码方法对测试进行编码,并利用基于功能覆盖率的适应度函数评估测试的优劣.通过遗传算法(GA)建立覆盖率与测试产生器之间的联系,分析覆盖率和测试之间的关系,根据分析结果改变测试产生器的约束和限制,驱动测试产生器生成新一代的测试,新一代的测试可以覆盖到上一代的测试无法覆盖的功能点.实验结果表明:在2个高性能的32位多核处理器的验证环境中,该测试产生器可以明显减少仿真时间,提高验证效率.

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