1. Micro-Satellite Research Center, Zhejiang University, Hangzhou 310027, China 2. Key Laboratory of Micro-Nano Satellite Research, Zhejiang Province, Zhejiang University, Hangzhou 310027, China
A high-precision error compensation method was proposed for the four-quadrant analog sun sensor in order to improve the accuracy of the micro-nano satellite attitude determination system. A completely automated calibration process was designed. The process of measuring the photogenerated current of the four-quadrant silicon photocell was analyzed, and the projection relationship of the incident sunlight was modeled to extract the main error sources. All aspects of the process were considered, and the current measurement errors in each channel were separately corrected. The errors caused by machining and installation errors and the errors caused by neglecting the thickness of the optical mask were compensated, which formed a complete compensation method. The experimental results showed that machining and installation errors were the main error sources, and the influence of the error caused by neglecting the thickness of the optical mask was slightly greater than that of the current measurement error. The average accuracy before compensation was 3.072° (1σ) within ±40° of incident angle, and the average accuracy was 0.177° (1σ) after compensation. The accuracy after calibration of the existing method was 0.5°(1σ). The calibration accuracy of the proposed method was improved by about three times compared with the existing method. A set of automated calibration test method for the whole process was designed aiming at the production process of calibration test, which obviously improved the calibration efficiency and was suitable for mass application.
Hua-jian DENG,Hao WANG,Ben-dong WANG,Zhong-he JIN. High-precision compensation and calibration method for four-quadrant analog sun sensor. Journal of ZheJiang University (Engineering Science), 2021, 55(10): 1993-2001.
Fig.1Schematic diagram of measurement process of four-quadrant analog sun sensor
Fig.2Measurement process of analog sun sensor photocurrent
Fig.3Influence of response coefficient of silicon photodiode 1 on precision of analog sun sensor
Fig.4Schematic diagram of sunlight incidence from third quadrant (α = 25°, β = 25°)
Fig.5Influence of optical mask thickness on precision of analog sun sensor
Fig.6Calibration and parameter injection process of analog sun sensor
Fig.7Calibration system of sun sensor
Fig.8Block diagram of sun sensor calibration system
Fig.9Data distribution of calibration points and evaluation points
Fig.10Deviation angle distribution of analog sun sensor
补偿方法
${{\Delta }}\bar \theta $/（°）
σΔθ /（°）
完整补偿方法
0.177
0.025
忽略电流测量误差
0.215
0.034
忽略遮光罩厚度
0.350
0.065
忽略机械加工与安装误差
1.296
0.525
补偿前
3.072
0.514
Tab.1Accuracy evaluation of analog sun sensor after calibration
Fig.11Accuracy evaluation of analog sun sensor after calibration
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