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Multi-layered model for radio frequency identification adoption oriented to discrete manufacturing enterprise |
BAI Ao, TANG Ren-zhong, WANG Zhi-guo, QI Guo-ning |
(Institute of Manufacturing Engineering, Zhejiang Province Key Laboratory of Advanced Manufacturing Technology, Zhejiang University, Hangzhou 310027,China) |
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Abstract A multi-layered model centering on critical success factor/capability maturity model/technology acceptance model(CSF/CMM/TAM) was proposed to improve the efficiency and success rate of radio frequency identification(RFID) adoption for small and medium-sized discrete manufacturing enterprise(SM-DME).Main-obstacles of RFID adoption were analyzed;differences between RFID and other enterprise information systems(EIS) were compared;CSF, CMM and TAM for RFID adoption were researched.Then a multi-layered model for RFID adoption(RFID-AMM) consisting of business layer,application layer,management layer,factor layer,ability layer,user layer,method layer,implementation layer,integration layer and target layer was constructed, and its function mechanism was described using formal language. A RFID adoption assisted analysis platform(RFID-AAAP) was developed to simplify computation.Practical application in a garment manufacturer proves that the proposed model can meet the need of RFID adoption for SM-DME.
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Published: 16 January 2010
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离散制造业射频识别技术导入的多层决策模型
为提高中小离散制造企业射频识别技术(RFID)导入的效率和成功率,提出了一种关键成功因素/能力成熟度/技术接受度(CSF/CMM/TAM)为核心的多层次模型.分析了RFID导入障碍,比较了RFID与其他企业信息系统之间的区别,研究了针对RFID导入的关键成功因素、能力成熟度模型和技术接受模型.在此基础上构建了由业务层、应用层、管理层、因素层、能力层、用户层、方法层、实施层、集成层和目标层组成的多层次RFID导入模型,并用形式化语言描述了其作用机理.为简化计算,开发了RFID导入辅助分析平台.某服装制造企业的实际应用表明,该模型能满足中小离散制造企业导入RFID的要求.
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