A multi-layered model centering on critical success factor/capability maturity model/technology acceptance model(CSF/CMM/TAM) was proposed to improve the efficiency and success rate of radio frequency identification(RFID) adoption for small and medium-sized discrete manufacturing enterprise(SM-DME).Main-obstacles of RFID adoption were analyzed;differences between RFID and other enterprise information systems(EIS) were compared;CSF, CMM and TAM for RFID adoption were researched.Then a multi-layered model for RFID adoption(RFID-AMM) consisting of business layer,application layer,management layer,factor layer,ability layer,user layer,method layer,implementation layer,integration layer and target layer was constructed, and its function mechanism was described using formal language. A RFID adoption assisted analysis platform(RFID-AAAP) was developed to simplify computation.Practical application in a garment manufacturer proves that the proposed model can meet the need of RFID adoption for SM-DME.
BAI Ao, TANG Lin-Zhong, WANG Zhi-Guo, et al. Multi-layered model for radio frequency identification adoption oriented to discrete manufacturing enterprise. J4, 2009, 43(12): 2196-2202.
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