航空航天技术 |
|
|
|
|
噪声测试系统精度有源-无源联合测量评估方法 |
顾易帆(),王立平,丁旭,王志宇*(),莫炯炯,郁发新 |
浙江大学 航空航天学院,浙江 杭州 310027 |
|
Active-passive joint measurement and evaluation method for precision of noise test system |
Yi-fan GU(),Li-ping WANG,Xu DING,Zhi-yu WANG*(),Jiong-jiong MO,Fa-xin YU |
School of Aeronautics and Astronautics, Zhejiang University, Hangzhou 310027, China |
引用本文:
顾易帆,王立平,丁旭,王志宇,莫炯炯,郁发新. 噪声测试系统精度有源-无源联合测量评估方法[J]. 浙江大学学报(工学版), 2020, 54(3): 574-580.
Yi-fan GU,Li-ping WANG,Xu DING,Zhi-yu WANG,Jiong-jiong MO,Fa-xin YU. Active-passive joint measurement and evaluation method for precision of noise test system. Journal of ZheJiang University (Engineering Science), 2020, 54(3): 574-580.
链接本文:
http://www.zjujournals.com/eng/CN/10.3785/j.issn.1008-973X.2020.03.018
或
http://www.zjujournals.com/eng/CN/Y2020/V54/I3/574
|
1 |
KEYSIGHT TECHNOLOGIES. Noise figure measurement accuracy: the Y-factor method [EB/OL]. [2019-04-10]. https://literature.cdn.keysight.com/litweb/pdf/5952-3706E.pdf?id=1000000179:epsg:apn.
|
2 |
KEYSIGHT TECHNOLOGIES. Fundamentals of RF and microwave noise figure measurements [EB/OL]. [2019-04-10]. https://literature.cdn.keysight.com/litweb/pdf/5952-8255E.pdf?id=1000001634:epsg:apn.
|
3 |
KEYSIGHT TECHNOLOGIES. NFA X-series noise figure analyzer: multi-touch N8973B, N8974B, N8975B, N8976B [EB/OL]. [2019-04-10]. https://literature.cdn.keysight.com/litweb/pdf/5992-1270EN.pdf?id=2702444.
|
4 |
DUNSMORE J P. Handbook of microwave component measurements with advanced VNA techniques[M]. Hoboken: JOHN WILEY & SONS Inc, 2012.
|
5 |
KEYSIGHT TECHNOLOGIES. High-accuracy noise figure measurements using the PNA-X series network analyzer [EB/OL]. [2019-04-10]. https://literature.cdn.keysight.com/litweb/pdf/5990-5800EN.pdf?id=1961132.
|
6 |
DUNSMORE J, FELLOW K. Noise figure verification of Y-factor and cold source methods [C] // International Conference on Noise and Fluctuations. Vilnius: IEEE, 2017: 1-4.
|
7 |
DUNSMORE J, WOOD S. Vector corrected noise figure and noise parameter measurements of differential amplifiers [C] // Microwave Conference. Rome: IEEE, 2009: 707-710.
|
8 |
KELLOGG K, DUNLEAVY L, SNIDER A D. Temperature dependent noise system verification and the relationship of passive noise parameters to available gain calculations [C] // 2018 IEEE 19th Wireless and Microwave Technology Conference (WAMICON). Key: IEEE, 2018: 1-4.
|
9 |
KELLOGG K, DUNLEAVY L, SKIDMORE S, et al. The impact of ENR and coaxial calibration in accurate on-wafer noise parameter testing for ultra-low noise devices [C] // 201688th ARFTG Microwave Measurement Conference (ARFTG). Austin: IEEE, 2016: 1-4.
|
10 |
RANDA J Uncertainty analysis for noise-parameter measurements at NIST[J]. IEEE Transactions on Instrumentation and Measurement, 2009, 58 (4): 1146- 1151
doi: 10.1109/TIM.2008.2007044
|
11 |
HSIAO H F, TU C H, CHANG D C, et al. Noise figure verification using cold-Source and Y-factor technique for amplifier and down-converted mixer [C] // Microwave Conference. Sendai: IEEE, 2014: 901-903.
|
12 |
BELOSTOTSKI L, HASLETT J W Evaluation of tuner-based noise-parameter extraction methods for very low noise amplifiers[J]. IEEE Transactions on Microwave Theory and Techniques, 2010, 58 (1): 236- 250
doi: 10.1109/TMTT.2009.2036411
|
13 |
GU D, RANDA J, BILLINGER R, et al. A verification method for noise-temperature measurements on cryogenic low-noise amplifiers [C] // 2012 Conference on Precision electromagnetic Measurements. Washington DC: IEEE, 2012: 32-33.
|
14 |
WU A, LI C, SUN J, et al. Development of a verification technique for on-wafer noise figure measurement systems [C] // 2017 90th ARFTG Microwave Measurement Symposium (ARFTG). Boulder: IEEE, 2017: 1-4.
|
15 |
WONG K, POLLARD R, SHOULDERS B, et al. Using a mismatch transmission line to verify accuracy of a high performance noise figure measurement system [C] // 2007 69th ARFTG Conference. Honolulu: IEEE, 2007: 1-5.
|
16 |
RANDA J, DUNSMORE J, GU D, et al Verification of noise-parameter measurements and uncertainties[J]. IEEE Transactions on Instrumentation and Measurement, 2011, 60 (11): 3685- 3693
doi: 10.1109/TIM.2011.2138270
|
17 |
KEYSIGHT TECHNOLOGIES. Non-zero noise figureafter calibration [EB/OL]. [2019-04-10]. https://literature.cdn.keysight.com/litweb/pdf/5989-0270EN.pdf?id=405518.
|
18 |
WIATR W, WALKER D Systematic errors of noise parameter determination caused by imperfect source impedance measurement[J]. IEEE Transactions on Instrumentation and Measurement, 2005, 54 (2): 696- 700
doi: 10.1109/TIM.2005.843534
|
19 |
SEELMANN-EGGEBERT M, BALDISCHWEILER B, AJA B, et al. Figures of uncertainty for noise measurements [C] // 81st ARFTG Microwave Measurement Conference. Seattle: IEEE, 2013: 1-4.
|
20 |
RUDOLPH M, HEYMANN P, BOSS H Impact of receiver bandwidth and nonlinearity on noise measurement methods[J]. IEEE Microwave Magazine, 2010, 11 (6): 110- 121
doi: 10.1109/MMM.2010.937715
|
21 |
KEYSIGHT TECHNOLOGIES. Noise figure uncertainty [EB/OL]. [2019-04-10]. http://rfmw.em.keysight.com/NFUcalc.
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
|
Shared |
|
|
|
|
|
Discussed |
|
|
|
|