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J4  2011, Vol. 45 Issue (9): 1539-1543    DOI: 10.3785/j.issn.1008-973X.2011.09.005
    
Random generation and variable ordering of fault tree
MO Yu-chang1,2, YANG Quan-sheng2
1.College of Mathematics Physics and Information Engineering, Zhejiang Normal University, Jinhua 321004,China;
2. School of Computer Science and Engineering, Southeast University, Nanjing 210096,China
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Abstract  

To cope with the problems related to benchmark size and diversity for performance evaluation of fault tree analysis methods, based on the idea of random generation of fault trees, this work proposed six important structural characteristic parameters of various fault trees, a top-down generation algorithm according to these parameters, which included a random tree skeleton generation algorithm and a randomly repeated leaf sequence generation algorithm, then illustrated the benchmark application with variable ordering heuristic performance evaluation. The evaluation shows that: deep (DEEP) heuristic is far superior to the wide (WIDE) heuristic; the superiority of the WIDE heuristic depends on the number of repeated leaves in the fault tree; improved weighting deep (WDEEP) heuristic is a complementary strategy for DEEP heuristic and not able to replace it.



Published: 01 September 2011
CLC:  TB 114  
Cite this article:

MO Yu-chang, YANG Quan-sheng. Random generation and variable ordering of fault tree. J4, 2011, 45(9): 1539-1543.

URL:

https://www.zjujournals.com/eng/10.3785/j.issn.1008-973X.2011.09.005     OR     https://www.zjujournals.com/eng/Y2011/V45/I9/1539


故障树随机生成及变量排序

针对故障树分析方法性能评价研究中存在的测试基准规模和多样性问题,基于故障树样本随机生成的思想,确定了故障树6个主要结构特征,并依据这些结构特征给出了自顶向下地生成算法,包括随机树骨架生成算法和随机重复度叶子序列生成算法.通过变量排序策略性能评价给出了测试基准的示范应用.性能评价表明:深度策略(DEEP)性能远优于广度策略(WIDE);WIDE策略的优越性依赖于重复叶子节点数量;改进带权值深度策略(WDEEP)是DEEP策略的互补策略并不能够代替DEEP策略.

[1] 孙艳, 杜素果. 一种二元决策图底事件排序的新方法.[J].系统管理学,2008, 17(2):210-216.
SUN yan, DU Suguo. A novel ordering method of binary decision diagram[J]. Journal of Systems & Management,2008, 17(2):210-216.
[2] BARTLETT L M. Neural network selection mechanism for BDD construction[J]. Quality and Reliability Engineering International,2004, 20(3):217-223.
[3] BARTLETT L M, ANDREW J D. Selecting an ordering heuristic for the fault tree to binary decision diagram conversion process using neural networks[J]. IEEE Transactions on Reliability,2002, 51(3): 344-349.
[4] BOUISSOU M, BRUYERE F, RAUZY A. BDDbased fault tree processing: A comparison of variable ordering heuristics[C]∥Proceedings of ESREL97. Lisbon, Portugal: Pergamon Press, 1997:2045-2052.
[5] MO Yuchang. Variable ordering to improve BDD analysis of phasedmission systems with multimode failures[J]. IEEE Transactions on Reliability,2009, 58(1):53-57.
[6] MO Yuchang. New insights into the BDDbased reliability analysis of phasedmission systems[J]. IEEE Transactions on Reliability, 2009, 58(4):667-678.
[7] XING L, MESHKAT L, DONOHUE S K. Reliability analysis of hierarchical computerbased systems subject to commoncause failures[J]. Reliability Engineering and System Safety, 2007, 92(3):351-359.
[8] XING L. Reliability evaluation of phasedmission systems with imperfect fault coverage and commoncause failures[J]. IEEE Transactions on Reliability,2007, 56(1):58-68.
[9] SHRESTHA A,XING L. A Logarithmic binary decision diagramsbased method for multistate systems analysis[J]. IEEE Transactions on Reliability, 2008, 57(4):595-606.
[10] TANG Z, DUGAN J B. BDDbased reliability analysis of phased mission systems with multimode failures[J]. IEEE Transactions on Reliability,2006, 55(2):350-360.
[11] OU Y, DUGAN J B. Modular solution of dynamic multiphase systems[J]. IEEE Transactions on Reliability,2004, 53(4):499-508.
[12] RAUZY A. New algorithms for fault tree analysis[J]. Reliability Engineering and System Safety, 1993, 40:203211.
[13] BOLLIG B, WEGENER I. Improving the variable ordering of OBDDs is NPcomplete[J]. IEEE Transactions on Computers, 1996, 45(9):993-1002.
[14] FRIEDMAN S J, SUPOWIT K J. Finding the optimal variable ordering for binary decision diagrams[J]. IEEE Transactions on Computers,1990, 39(5):710-713.

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