[1] NELSON W B. Analysis of performance: degradation data from accelerated tests [J]. IEEE Transactions on Reliability, 1981, 30(2): 149-155.
[2] 林瑞进,陈文华,刘娟,等.航天电连接器加速性能退化试验可行性研究[J].工程设计学报,2010,17(4):318-320.
LIN Rui-jin, CHEN Wen-hua, LIU Juan, et al. Research on feasibility of accelerated degradation test for aerospace electrical connector [J]. Journal of Engineering Design, 2010, 17(4): 318-320.
[3] 葛蒸蒸,李晓阳,姜同敏.费用约束下含应力优化的CSADT设计[J].北京航空航天大学学报,2011,37(10): 1277-1278.
GE Zheng-zheng, LI Xiao-yang, JIANG Tong-min. Planning of CSADT with stress optimization under cost constraint [J]. Journal of Beijing University of Aeronautics and Astronautics, 2011, 37(10): 1277-1278.
[4] WANG X. Nonparametric estimation of the shape function in a Gamma process for degradation data [J]. The Canadian Journal of Statistics, 2009, 37(1): 102-118.
[5] TSAI C C, TSENG S T, BALAKRISHNAN N. Optimal design for degradation tests based on Gamma processes with random effects [J]. IEEE Transactions on Reliability, 2012, 61(2): 604-613.
[6] WANG X L, JIANG P, GUO B, et al. Real-time reliability evaluation for an individual product based on change-point Gamma and Wiener process [J]. Quality and Reliability Engineering International, 2014, 30(4): 513-525.
[7] VAN NOORTWIJK J M. A survey of the application of Gamma processes in maintenance [J]. Reliability Engineering and System Safety, 2009, 94(1): 221.
[8] WANG H W, XU T X, MI Q L. Lifetime prediction based on Gamma processes from accelerated degradation data [J]. Chinese Journal of Aeronautics, 2015, 28(1): 172-179.
[9] 周源泉,翁朝曦,叶喜涛.论加速系数与失效机理不变的条件(Ⅰ):寿命型随机变量的情况[J].系统工程与电子技术, 1996, 18(1): 55-66.
ZHOU Yuan-quan, WENG Chao-xi, YE Xi-tao. Study on accelerated factor and condition for constant failure mechanism [J]. Systems Engineering and Electronics, 1996, 18(1): 55-66.
[10] 杨宇航,周源泉.加速寿命试验的理论基础(Ⅰ)[J].推进技术,2001, 22(4): 276-278.
YANG Yu-hang, ZHOU Yuan-quan. Theoretical foundation of accelerated life testing(Ⅰ) [J]. Journal of Propulsion Technology, 2001, 22(4): 276-278.
[11] 王浩伟,徐廷学,赵建忠.融合加速退化和现场实测退化数据的剩余寿命预测方法[J].航空学报, 2014, 35(12): 3350-3357.
WANG Hao-wei, XU Ting-xue, ZHAO Jian-zhong. Residual life prediction method fusing accelerated degradation and field degradation data [J]. Acta Aeronautica et Astronautica Sinica, 2014, 35(12): 3350-3357.
[12] GRACE A W, WOOD I A. Approximating the tail of the Anderson-Darling distribution [J]. Computational Statistics and Data Analysis, 2012, 56(12): 4301-4311.
[13] TSENG S T, BALAKRISHNAN N, TSAI C C. Optimal step-stress accelerated degradation test plan for Gamma degradation processes [J]. IEEE Transactions on Reliability, 2009, 58(4): 611-618.
[14] NTZOUFRAS I. Bayesian modeling using WinBUGS [M]. New York: Wiley, 2009: 1255.
[15] 王浩伟,徐廷学,周伟.综合退化数据与寿命数据的某型电连接器寿命预测方法[J].上海交通大学学报,2014, 48(5): 702-706.
WANG Hao-wei, XU Ting-xue, ZHOU Wei. Lifetime prediction method for missile electrical connector synthesizing degradation data and lifetime data [J]. Journal of Shanghai Jiao Tong University, 2014, 48(5): 702-706. |