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J4  2013, Vol. 47 Issue (6): 984-989    DOI: 10.3785/j.issn.1008-973X.2013.06.008
    
Microelectrode array sensor chip for detection of heavy metals in water pollution
ZHAO Hui-xin, WAN Hao, CAI Wei, HA Da, WANG Ping
Biosensor National Special Laboratory, Key Laboratory of Biomedical Engineering of Ministry of Education, Department of Biomedical Engineering, Zhejiang University, Hangzhou 310027, China
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Abstract  

Based on stripping voltammetry, a novel gold microelectrode array (MEA) sensor chip with mercury film plated was used for simultaneously detection of trace heavy metal ions Zn2+, Cd2+, Pb2+ and Cu2+ in water pollution. The electrochemical behavior and the actual surface area of the MEA were investigated by cyclic voltammetry in K3[Fe(CN)6] solution. Electrochemical impedance spectrum (EIS) was utilized to examine the mercury deposition extent on the surface of the MEA. Mercury film plated MEA was then applied to simultaneously detect four heavy metal elements Zn2+,Cd2+,Pb2+ and Cu2+ in sample solutions using differential pulse anodic stripping voltammetry, where good linearities of the standard working curves were obtained for Cd2+,Pb2+ and Cu2+ with the detection limits of 0.1, 0.5 and 0.3 μg/L, separately. But the linearity of the standard working curve was poor for Zn2+, which was mainly caused by the excursion of the testing baseline and the inaccurate addition.



Published: 22 November 2013
CLC:  TP 212.2  
Cite this article:

ZHAO Hui-xin, WAN Hao, CAI Wei, HA Da, WANG Ping. Microelectrode array sensor chip for detection of heavy metals in water pollution. J4, 2013, 47(6): 984-989.

URL:

http://www.zjujournals.com/eng/10.3785/j.issn.1008-973X.2013.06.008     OR     http://www.zjujournals.com/eng/Y2013/V47/I6/984


用于水污染重金属检测的微电极阵列传感器芯片

基于溶出伏安法,采用一种新型的汞膜金微电极阵列传感器芯片,实现了水污染痕量重金属离子Zn2+、Cd2+、Pb2+和Cu2+的同时检测.在K3[Fe(CN)6]溶液中对微电极阵列传感器进行循环伏安扫描,分析其电化学特性及实际表面积,采用电化学阻抗谱法检验微电极阵列传感器表面汞膜沉积的程度.镀汞后的微电极阵列传感器采用差分脉冲阳极溶出伏安法,同时检测样本溶液中的重金属元素:Zn2+、Cd2+、Pb2+和Cu2+,得到的Cd2+、Pb2+和Cu2+的标准工作曲线线性度良好,检测下限分别为0.1、0.5和0.3 μg/L,但Zn2+的标准工作曲线线性度较差,这主要是由测试基线的漂移及不准确的加标造成的.

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