[1] KOENEMANN B.LFSRcoded test patterns for scan designs [C]∥Proceedings of European Test Conference. Muni ch:VDEVerlag,1991:237-242.
[2] HELLEBRAND S,TARNICK S,RAJSKI J, et al. Generation of vector patterns through reseeding of multiplepolynomial linear feedback shift register [C]∥Proceedings of International Test Conference. Baltimore, MD∶IEEE ,1992:120-129.
[3] KRISHNA C V,JAS A,TOUBA N A .Test vector encoding using partial LFSR reseeding [C]∥Proceedings of International Test Conference. Baltimore, MD: IEEE, 2001: 885-893.
[4] JAS A,DASTIDAR J G,TOUBA N A . Scan vector compre ssion/decompression using statistical coding [C]∥Proceedings of the 17th IEEE VLSI Test Symposium . Dana Point, California: IEEE ,1999:114-120.
[5] CHANDRA A,CHAKRABARTY K . System-on-a-Chip test data compression and decompression architectures based on Golomb codes [J].IEEE Transactions on CAD of Integrated Circuits and System,2001,20(3):355-368.
[6] CHANDRA A,CHAKRABARTY K. Frequency-directed run-length(FDR) codes of with application to system-on-a-chip test data compression [C]∥Proceedings of the 19th IEEE VLSI Testing Symposium . Washington D C:IEEE ,2001:42-47.
[7] ELMALEH A,ALABAJI R. Extended frequency-directed run-length codes with improved application to system-on-a-C-hip test data compression [C]∥Proceedings of International Conference Electronics, Circuits and System. Dubrovnik, Croatia:IEEE,2002:449-452.
[8] WUERTENBERGER A,TAUTERMANN C S.HELLEBR AND S.A hybrid coding strategy for optimized test data compression [C]∥Proceedings of International Test Conferenc e. Charlotte, NC,USA:IEEE ,2003:451-459.
[9] 梁华国,蒋翠云.基于交替与连续长度码的有效测试数据压缩和解压[J].计算机学报,2004,27(4):549-554.
LIANG Huaguo, JIANG Cuiyun . Efficient test data compress ion and decompression based on alternation and run length codes [J].Chinese Journal of Computers,2004,27(4):548-554.
[10] 李国亮,冯建华,崔小乐. 基于PTIDR编码的测试数据压缩算法[J]. 计算机辅助设计与图形学学报,2008,20(2):161-166.
LI Guoliang, FENG Jianhua, CUI Xiaole. A test set compression algorithm based on PTIDR code [J]. Journal of Computer Aided Design & Computer Graphics,2008,20 (2):161-166.
[11] JAS A,TOUBA N A. Test vector decompression via cyclical scan chains and its application to testing corebased designs [C]∥Proceedings of International Test Conference. Washington, DC:IEEE,1998:458-464.
[12] 张念,梁华国,祝沈财,等.基于分组共享种子和位翻转的测试数据压缩方法[J].合肥工业大学学报,2008,31(8):1176-1180.
ZHANG Nian, LIANG Huaguo, ZHU Shencai, et al. Test data compression based on grouping of share seeds and bitflipping [J].Journal of Hefei University of Technology,2008,31 (8):1176-1180.
[13] LEE J,TOUBA N A .Combining linear and nonlinear test vector compression using correlationbased rectangular encod ing [C]∥Proceedings of the 24th IEEE VLSI Test Symposium. Berkeley, California: IEEE ,2006:252-257.
[14] 欧阳一鸣,肖祝红,梁华国.数据块前相容标记码的测试数据压缩方法[J].计算机辅助设计与图形学学报,2007,19(8):986-990.
OUYANG Yiming, XIAO Zhuhong, LIANG Huaguo. A test data compression method of forecompatible marked codes of data blocks [J].Journal of Computer Aided Design & Computer Graphics,2007,19(8):986-990.
[15] ELMALEH A H. Efficient test compression technique based on block merging [J].Computers & Digital Techniques, IET,2008,2(5):327-335.
[16] 韩银和,李晓维,徐勇军,等.应用VariableTail编码压缩的测试资源划分方法[J].电子学报,2004,32(8):1346-1350.
HAN Yinhe, LI Xiaowei, XU Yongjun, et al. Test res ource partitioning using VariableTail code [J].Acta Electronic Sinica, 2004,32(8):1346-1350. |