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浙江大学学报(工学版)
浙江大学学报(工学版)  2018, Vol. 52 Issue (8): 1489-1498    DOI: 10.3785/j.issn.1008-973X.2018.08.008
航空航天技术     
基于C#的T/R多功能芯片可靠性测试系统
林琦, 卞悦, 丁旭, 莫炯炯, 陈华, 王志宇, 郁发新
浙江大学 航空航天学院, 浙江 杭州 310027
C# based reliability testing system for T/R multi-functional chips
LIN Qi, BIAN Yue, DING Xu, MO Jiong-jiong, CHEN Hua, WANG Zhi-yu, YU Fa-xin
School of Aeronautics and Astronautics, Zhejiang University, Hangzhou 310027, China
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摘要：

为了在极端环境下对芯片进行高效准确的可靠性试验，利用C#编程语言和相应的测试设备与环境设备搭建多功能芯片（MFC）可靠性测试系统.系统针对自主研发的T/R多功能芯片的测试需求设计，通过设计现场可编程门阵列（FPGA）开发板，配合自主研发的多功能控制芯片实现控制信号的串并转换，简单、准确地切换待测芯片工作状态.综合可视化编程技术、虚拟仪器软件结构（VISA）、MYSQL数据库、串口通信技术，实现仪器一键设置、芯片状态自动切换、参数自动测试、数据自动处理保存与结果分析报告的功能.结合测试系统中的辅助测温系统和环境设备，对多功能芯片进行三温试验.经检验，整个测试系统操作简单、测试速度快、结果精确，支持多功能芯片的大部分可靠性试验需求.
Abstract:

In order to conduct reliability testing of chips efficiently and accurately in extreme environment, an reliability testing system based on C# programming language, testing devices and environment devices was designed for T/R multi-function chips (MFC). The combination of a self-designed field-programmable gate array (FPGA) and a self-developed control chip enables the serial-to-parallel conversion of the control signal as well as easy and accurate switches of chips' work states. Software functions such as one-key set, automatic conversion of chip work state, automatic testing, data processing and storage, result analysis and report were realized by synthesizing technologies of visual programming, VISA, MYSQL and serial port communication. Combined with a temperature testing system and environment devices, the automatic testing system was used for three temperature testing. The system shows conciseness, speediness and accuracy, which satisfies most reliability testing of multi-functional chips.
收稿日期: 2017-06-13 出版日期: 2018-08-23
CLC:  TN407  
基金资助:

国家自然科学基金资助项目（61401395，61604128）；浙江省教育厅资助项目（Y201533913）；中央高校基本科研业务费专项资助项目（2016QNA4025）
通讯作者: 王志宇,男,副教授,博士.orcid.org/0000-0001-9699-1213.     E-mail: zywang@zju.edu.cn
作者简介: 林琦(1992-),男,硕士生,从事微波射频集成电路自动测试技术研究.orcid.org/0000-0001-7791-2348.E-mail:lqyyawq@zju.edu.cn
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引用本文:

林琦, 卞悦, 丁旭, 莫炯炯, 陈华, 王志宇, 郁发新. 基于C#的T/R多功能芯片可靠性测试系统[J]. 浙江大学学报(工学版), 2018, 52(8): 1489-1498.

LIN Qi, BIAN Yue, DING Xu, MO Jiong-jiong, CHEN Hua, WANG Zhi-yu, YU Fa-xin. C# based reliability testing system for T/R multi-functional chips. JOURNAL OF ZHEJIANG UNIVERSITY (ENGINEERING SCIENCE), 2018, 52(8): 1489-1498.

链接本文:

http://www.zjujournals.com/eng/CN/10.3785/j.issn.1008-973X.2018.08.008    或    http://www.zjujournals.com/eng/CN/Y2018/V52/I8/1489

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