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浙江大学学报(工学版)
J4  2010, Vol. 44 Issue (6): 1067-1072    DOI: 10.3785/j.issn.1008-973X.2010.06.003
自动化技术、计算机技术     
基于调试异常模型的嵌入式处理器片上调试设计
刘鹏1, 钟耿1, 徐国柱1,2, 邬可俊1
1.浙江大学 信息与电子工程学系, 浙江 杭州310027; 2.杭州士兰微电子股份有限公司,浙江 杭州 310012
On-chip debug design based on debug exception model for embedded processor
LIU Peng1, ZHONG Geng1, XU Guo-zhu1,2, WU Ke-jun1
1. Department of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China;
2. Hangzhou Silan Microelectronics CO.,LTD, Hangzhou 310012, China
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摘要：

针对调试的可移植性, 建立同流水相关的精确调试异常模型, 模型通过增加调试中断、单步、软硬件断点等精确调试异常的产生和处理机制、片外调试存储空间以及基于JTAG（joint test action group）的快速通信协议, 实现一种通过JTAG接口的嵌入式处理器核的片上调试方案. 该调试模型在嵌入式处理器RISC32E核的应用实现表明,它具有良好的可观察性和可控制性,并且该模型的应用不局限于六级流水结构的微处理器,还可以方便地推广到其他流水结构的微处理器.对比调试过程中的一些基本调试操作开销,该调试方案具有较高的调试效率.
Abstract:

A general precise debug exception model based on pipeline was established with portability, which provides a strategy for on-chip debug by adding generation and processing mechanism of precise debug exceptions, such as debug interrupt, step, hardware/software breakpoints, etc., in addition of a segment of offchip debug memory and a fast transfer method through joint test action group(JTAG) port. The implementation of the proposed model on an embedded processor RISC32E shows that it meets the requirements of observability and controllability. The above description should not be taken as limiting the utilization of the model which is defined by the sixpipeline microprocessor. The model can be easily transplanted onto other microprocessors which have various modifications of pipeline. The proposed strategy has great efficiency of debugging in the case of comparison of some basic debugging operation overhead.
出版日期: 2010-07-16
:  TP 316  
作者简介: 刘鹏（1970—），男，陕西铜川人，副教授，主要从事计算机体系结构、集成电路设计和并行处理等研究.
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引用本文:

刘鹏, 钟耿, 徐国柱, 邬可俊. 基于调试异常模型的嵌入式处理器片上调试设计[J]. J4, 2010, 44(6): 1067-1072.

LIU Feng, ZHONG Geng, XU Guo-Zhu, WU Ge-Dun. On-chip debug design based on debug exception model for embedded processor. J4, 2010, 44(6): 1067-1072.

链接本文:

http://www.zjujournals.com/eng/CN/10.3785/j.issn.1008-973X.2010.06.003    或    http://www.zjujournals.com/eng/CN/Y2010/V44/I6/1067

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