光学工程、生物医学工程 |
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适于大口径精密光学表面疵病图像的拼接算法 |
肖冰, 杨甬英, 高鑫, 刘东, 王道档, 卓永模 |
浙江大学 现代光学仪器国家重点实验室,浙江 杭州 310027 |
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Mosaic algorithm for images of defects on surface of large fine optics |
XIAO Bing, YANG Yong-ying, GAO Xin, LIU Dong, WANG Dao-dang, ZHUO Yong-mo |
State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027,China |
引用本文:
肖冰, 杨甬英, 高鑫, 刘东, 王道档, 卓永模. 适于大口径精密光学表面疵病图像的拼接算法[J]. J4, 2011, 45(2): 375-381.
XIAO Bing, YANG Yong-ying, GAO Xin, LIU Dong, WANG Dao-dang, ZHUO Yong-mo. Mosaic algorithm for images of defects on surface of large fine optics. J4, 2011, 45(2): 375-381.
链接本文:
http://www.zjujournals.com/eng/CN/10.3785/j.issn.1008-973X.2011.02.029
或
http://www.zjujournals.com/eng/CN/Y2011/V45/I2/375
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[1] CONDER A, ALGER T, AZEVEDO S, et al. Final optics damage inspection (FODI) for the National Ignition Facility [C]∥Proceedings of SPIE 6720. Boulder: SPIE, 2007: 672010.
[2] LORINCIK J, FINE J, GILLEN G. Scanning scattering microscope for surface and buried interface roughness and defect imaging [C]∥Proceedings of SPIE 3141. San Diego: SPIE, 1997: 302-315.
[3] WANG Jun, UDUPA G, NGOI B. Highspeed image for evaluation of silicon wafer defects[C]∥Proceedings of SPIE 5852. Singapore: SPIE, 2005: 593-598.
[4] 杨甬英,陆春华,梁蛟,等.光学元件表面缺陷的显微散射暗场成像及数字化评价系统[J].光学学报,2007,27(6): 1031-1038.
YANG Yongying, LU Chunhua, LIANG Jiao, et al. Microscopic darkfield scattering imaging and digitalization evaluation system of defects on optical devices precision surface [J]. Acta Optica Sinica, 2007, 27(6): 1031-1038.
[5] SUN Dandan, YANG Yongying, WANG Fengquan, et al. Microscopic scattering imaging system of defects on ultrasmooth surface suitable for digital image processing [C]∥Proceedings of SPIE 6150. Xi’an: SPIE, 2006: 615012.
[6] 陆春华.基于机器视觉的大口径精密表面疵病检测系统研究[D].杭州:浙江大学,2008: 16-18.
LU Chunhua. Research on the system of large aperture precise surface defects detection based on machine vision[D]. Hangzhou: Zhejiang University, 2008: 16-18.
[7] WANG Fengquan, YANG Yongying, SUN Dandan, et al. Digital realization of precision surface defect evaluation system [C]∥Proceedings of SPIE 6150. Xi’an: SPIE, 2006: 61500F.
[8] ISO 101107: 2008(E). Optics and photonicsPreparation of drawings for optical elements and systemsPart 7: Surface imperfection tolerances [S]. Geneva: International Standard Organization, 2008.
[9] 刘旭,杨甬英,刘东,等.光学元件表面疵病检测扫描拼接的误差分析[J].光电子激光,2008,19(8): 1088-1093.
LIU Xu, YANG Yongying, LIU Dong, et al. Error analysis of subaperture synthesis for detecting surface defects of optical components[J]. Journal of Optoelectronics Laser, 2008, 19(8): 1088-1093.
[10] HARALICK R, SHAPIRO L. Computer and robot vision, Vol. 1[M]. Boston: AddisonWesley Longman Publishing Co., Inc, 1992: 59-94.
[11] WANG Shengsheng, WANG Xinying, LIU Dayou. Multigranularities approximate method for obtaining qualitative spatial relations [C]∥Proceedings of the Seventh International Conference on Machine Learning and Cybernetics. Kunming: IEEE, 2008: 1323-1328. |
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