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Journal of Zhejiang University-SCIENCE A (Applied Physics & Engineering)  2007, Vol. 8 Issue (3 ): 1-    DOI: 10.1631/jzus.2007.A0335
    
Vacuum interrupter, high reliability component of distribution switches, circuit breakers and contactors
Slade Paul G., Li Wang-Pei, Mayo Stephen, Smith R. Kirkland, Taylor Erik D.
Eaton Electrical, Horseheads, NY 14845, USA
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Abstract  The use of vacuum interrupters (VIs) as the current interruption component for switches, circuit breakers, reclosers and contactors operating at distribution voltages has escalated since their introduction in the mid-1950’s. This electrical product has developed a dominating position for switching and protecting distribution circuits. VIs are even being introduced into switching products operating at transmission voltages. Among the reasons for the VI’s popularity are its compactness, its range of application, its low cost, its superb electrical and mechanical life and its ease of application. Its major advantage is its well-established reliability. In this paper we show how this reliability has been achieved by design, by mechanical life testing and by electrical performance testing. We introduce the “sealed for life” concept for the VI’s integrity. We discuss this in terms of what is meant by a practical leak rate for VIs with a life of over 30 years. We show that a simple high voltage withstand test is an easy and effective method for monitoring the long-term vacuum integrity. Finally we evaluate the need for routine inspection of this electrical product when it is used in adverse ambient environments.

Key wordsVacuum interrupter (VI)      Reliability      Mechanical life      Electrical life     
Received: 19 December 2006     
CLC:  TM5  
Cite this article:

Slade Paul G., Li Wang-Pei, Mayo Stephen, Smith R. Kirkland, Taylor Erik D.. Vacuum interrupter, high reliability component of distribution switches, circuit breakers and contactors. Journal of Zhejiang University-SCIENCE A (Applied Physics & Engineering), 2007, 8(3 ): 1-.

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http://www.zjujournals.com/xueshu/zjus-a/10.1631/jzus.2007.A0335     OR     http://www.zjujournals.com/xueshu/zjus-a/Y2007/V8/I3 /1

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