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考虑设计参数扰动的芯片多元参数成品率预测算法 |
Xin Li, Jin Sun, Fu Xiao |
Jiangsu High Technology Research Key Laboratory for Wireless Sensor Networks, Nanjing University of Posts and Telecommunications, Nanjing 210013, China; Technology Innovation Center, Jiangsu Academy of Safety Science and Technology, Nanjing 210042, China; School of Computer Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China |
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An efficient prediction framework for multi-parametric yield analysis under parameter variations |
Xin Li, Jin Sun, Fu Xiao |
Jiangsu High Technology Research Key Laboratory for Wireless Sensor Networks, Nanjing University of Posts and Telecommunications, Nanjing 210013, China; Technology Innovation Center, Jiangsu Academy of Safety Science and Technology, Nanjing 210042, China; School of Computer Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China |
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