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ZJUS-A
Journal of Zhejiang University-SCIENCE A (Applied Physics & Engineering)  2004, Vol. 5 Issue (1): 86-91    DOI: 10.1631/jzus.2004.0086
Advanced Manufacturing Engineering     
Inversion of thicknesses of multi-layered structures from eddy current testing measurements
HUANG Ping-jie, WU Zhao-tong
Institute of Advanced Manufacturing Engineering, Zhejiang University, Hangzhou 310027, China
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Abstract  Luquire et al.\'s impedance change model of a rectangular cross section probe coil above a structure with an arbitrary number of parallel layers was used to study the principle of measuring thicknesses of multi-layered structures in terms of eddy current testing voltage measurements. An experimental system for multi-layered thickness measurement was developed and several fitting models to formulate the relationships between detected impedance/voltage measurements and thickness are put forward using least square method. The determination of multi-layered thicknesses was investigated after inversing the voltage outputs of the detecting system. The best fitting and inversion models are presented.

Key words： Multi-layered structure      Thickness measurement      Eddy current testing      Multi-frequency      Inversion     
Received: 11 March 2003     
CLC:  TP391.7  
  TM13  
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HUANG Ping-jie, WU Zhao-tong. Inversion of thicknesses of multi-layered structures from eddy current testing measurements. Journal of Zhejiang University-SCIENCE A (Applied Physics & Engineering), 2004, 5(1): 86-91.

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http://www.zjujournals.com/xueshu/zjus-a/10.1631/jzus.2004.0086     OR     http://www.zjujournals.com/xueshu/zjus-a/Y2004/V5/I1/86

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