引用本文:

叶秀芬, 郑海鹰. 成败型部件冷贮备系统可靠性Fiducial下限[J]. 浙江大学学报（理学版）, 2010, 37(1): 30-33.

YE Xiu-Fen, ZHENG Hai-Ying. . Journal of ZheJIang University(Science Edition), 2010, 37(1): 30-33.

链接本文:

https://www.zjujournals.com/sci/CN/    或    https://www.zjujournals.com/sci/CN/Y2010/V37/I1/30