基于内蕴旋转对称性的器件瑕疵检测

周涛,王鹏飞,高伟杰

Device defect detection based on intrinsic rotational symmetry

Tao ZHOU,Pengfei WANG,Weijie GAO

图 5 噪声干扰下的模型优化结果

Fig.5 Model optimization results under noise interference