基于改进YOLOv5s的印刷电路板缺陷检测算法

周著国,鲁玉军,吕利叶

Improved YOLOv5s-based algorithm for printed circuit board defect detection

Zhuguo ZHOU,Yujun LU,Liye LV

图 4 跨阶段细节增强交互模块的结构

Fig.4 Structure of cross-stage detail enhancement interaction module