基于改进YOLOv5s的印刷电路板缺陷检测算法
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周著国,鲁玉军,吕利叶
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Improved YOLOv5s-based algorithm for printed circuit board defect detection
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Zhuguo ZHOU,Yujun LU,Liye LV
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表 4 不同文献算法以及YOLO系列算法检测结果对比 |
Tab.4 Comparison of detection results between different literature algorithms and YOLO series algorithms |
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算法 | P/% | mAP/% | S/MB | FLOPs/109 | v/(帧·s−1) | 服务器 | RK3568 | 文献[25]算法 | 93.2 | 95.8 | 5.8 | 12.6 | 128.0 | 46.1 | 文献[26]算法 | 94.7 | 96.5 | 3.8 | 5.2 | 88.4 | 20.5 | 文献[27]算法 | 93.9 | 97.3 | 10.5 | 11.8 | 137.8 | 63.8 | 文献[28]算法 | 91.6 | 95.5 | 92.3 | 41.4 | 92.5 | 21.4 | 文献[29]算法 | 93.2 | 96.4 | 20.1 | 12.8 | 48.9 | 11.3 | YOLOv5s | 96.3 | 94.8 | 13.4 | 15.8 | 128.4 | 52.2 | YOLOv7-tiny | 98.4 | 95.3 | 6.03 | 10.2 | 82.5 | 19.8 | YOLOv8n | 96.7 | 93.8 | 5.96 | 8.2 | 134.8 | 56.1 | Improved_YOLOv5s | 99.2 | 98.6 | 9.8 | 12.8 | 138.1 | 66.1 |
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