基于改进YOLOv5s的印刷电路板缺陷检测算法

周著国,鲁玉军,吕利叶

Improved YOLOv5s-based algorithm for printed circuit board defect detection

Zhuguo ZHOU,Yujun LU,Liye LV

表 2 不同聚类算法植入后的模型检测性能对比

Tab.2 Comparison of model detection performance after implanting different clustering algorithms

聚类算法 P/% mAP/% FLOPs/109 K-means 96.3 94.8 15.8 K-means++ 96.8 95.1 15.8 Binary K-means 96.9 95.4 15.8 DBSCAN 97.1 95.8 15.8 Agglomerative Clustering 94.7 91.8 15.8 Mean Shift 94.1 90.1 15.8 HDBK-means 97.3 96.4 15.8