基于改进YOLOv5s的印刷电路板缺陷检测算法

周著国,鲁玉军,吕利叶

Improved YOLOv5s-based algorithm for printed circuit board defect detection

Zhuguo ZHOU,Yujun LU,Liye LV

表 1 消融实验结果的对比

Tab.1 Comparison of ablation experimental result

实验编号 HDBK-means RepNCSPELAN _SSConv DySample RDEGFPN R/% P/% mAP/% S/MB FLOPs/109 1 × × × × 90.1 96.3 94.8 13.4 15.8 2 √ × × × 91.6 97.3 96.4 13.3 15.8 3 × √ × × 89.1 96.6 94.4 9.2 12.4 4 × × √ × 90.4 96.1 95.1 13.3 15.8 5 × × × √ 90.8 98.1 96.1 13.3 15.6 6 √ √ × × 90.1 96.6 95.1 9.4 12.4 7 √ × √ × 91.6 98.8 95.3 13.1 15.8 8 √ × × √ 92.2 98.0 97.5 13.2 15.5 9 × √ √ × 91.1 96.8 94.7 9.5 12.5 10 × √ × √ 93.4 98.1 97.3 9.6 12.2 11 × × √ √ 94.2 98.3 97.6 13.2 15.6 12 √ √ √ × 93.1 97.4 95.9 10.0 12.6 13 √ √ × √ 92.1 97.8 95.3 9.5 12.5 14 √ × √ √ 94.8 99.2 98.2 13.3 15.6 15 × √ √ √ 93.9 98.9 97.1 10.1 12.7 16 √ √ √ √ 95.5 99.2 98.6 9.8 12.8