基于改进YOLOv3的印刷电路板缺陷检测算法

卞佰成,陈田,吴入军,刘军

Improved YOLOv3-based defect detection algorithm for printed circuit board

Bai-cheng BIAN,Tian CHEN,Ru-jun WU,Jun LIU

图 7 AT-YOLO算法的AP增长曲线

Fig.7 AP growth curve of AT-YOLO algorithm