基于改进YOLOv3的印刷电路板缺陷检测算法
Improved YOLOv3-based defect detection algorithm for printed circuit board
基于改进YOLOv3的印刷电路板缺陷检测算法 |
| 卞佰成,陈田,吴入军,刘军 |
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Improved YOLOv3-based defect detection algorithm for printed circuit board |
| Bai-cheng BIAN,Tian CHEN,Ru-jun WU,Jun LIU |
| 图 5 不同背景下的缺陷检测效果 |
| Fig.5 Effect of defect detection in different backgrounds |
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