基于改进YOLOv3的印刷电路板缺陷检测算法

卞佰成,陈田,吴入军,刘军

Improved YOLOv3-based defect detection algorithm for printed circuit board

Bai-cheng BIAN,Tian CHEN,Ru-jun WU,Jun LIU

图 4 图片放大后的缺陷类型实例

Fig.4 Examples of defect types after image enlargement