基于改进YOLOv5的电子元件表面缺陷检测算法
Surface defect detection algorithm of electronic components based on improved YOLOv5
基于改进YOLOv5的电子元件表面缺陷检测算法 |
| 曾耀,高法钦 |
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Surface defect detection algorithm of electronic components based on improved YOLOv5 |
| Yao ZENG,Fa-qin GAO |
| 图 6 改进CSP_1的结构 |
| Fig.6 Structure of improved CSP_1 |
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