基于改进YOLOv3的印刷电路板缺陷检测算法
卞佰成,陈田,吴入军,刘军

Improved YOLOv3-based defect detection algorithm for printed circuit board
Bai-cheng BIAN,Tian CHEN,Ru-jun WU,Jun LIU
表 8 对改进算法进行消融实验的结果
Tab.8 Results of ablation experiments of improved algorithms
ResNeSt SPP 改进PANet 训练技巧 AP0.5/% pu/%
81.42
92.72 11.3↑
93.25 0.53↑
98.42 4.17