基于改进YOLOv3的印刷电路板缺陷检测算法
卞佰成,陈田,吴入军,刘军
Improved YOLOv3-based defect detection algorithm for printed circuit board
Bai-cheng BIAN,Tian CHEN,Ru-jun WU,Jun LIU
表 7
不同类别缺陷的AP
0.5
Tab.7
AP
0.5
for different categories of defects
缺陷类型
AP
0.5
/%
p
u
/%
Missing hole
98.90
0.48↑
Mouse bite
98.42
0
Open circuit
98.58
0.16↑
Short
97.29
−1.13↓
Spur
98.69
0.27↑
Spurious copper
98.61
0.19↑