基于改进YOLOv3的印刷电路板缺陷检测算法

卞佰成,陈田,吴入军,刘军

Improved YOLOv3-based defect detection algorithm for printed circuit board

Bai-cheng BIAN,Tian CHEN,Ru-jun WU,Jun LIU

表 3 改进PANet的4个变形对算法检测精度的测试结果

Tab.3 Test results of four variations of improved PANet on detection accuracy of algorithm

颈部网络 输入图像分辨率/像素 AP/% AP0.5/% AP0.75/% 结构A 416×416 61.07 98.43 68.41 结构B 416×416 64.53 98.42 76.23 结构C 416×416 61.06 98.52 69.71 结构D 416×416 62.46 98.22 72.78 改进PANet 416×416 59.71 97.60 66.78