基于改进YOLOv3的印刷电路板缺陷检测算法 |
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| 卞佰成,陈田,吴入军,刘军 | |||||||||||||||
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Improved YOLOv3-based defect detection algorithm for printed circuit board |
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| Bai-cheng BIAN,Tian CHEN,Ru-jun WU,Jun LIU | |||||||||||||||
| 表 2 不同大小的ResNeSt对算法检测精度的测试结果 | |||||||||||||||
| Tab.2 Test results of different sizes of ResNeSt on detection accuracy of algorithm | |||||||||||||||
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