基于优化变分模态分解的磁瓦内部缺陷检测

冉茂霞,黄沁元,刘鑫,宋弘,吴浩

Internal defect detection of arc magnets based on optimized variational mode decomposition

Mao-xia RAN,Qin-yuan HUANG,Xin LIU,Hong SONG,Hao WU

表 4 3种分类器对4种测试样本的识别率和识别时间

Tab.4 Recognition rate and time of three different classifiers for four types of testing samples

样本类型 RF SVM BPNN ${R_{\rm{D} }/\text{%} }$ ${R_{\rm{N} } /\text{%}}$ ${R_{\rm{T} }/\text{%} }$ ST/s ${R_{\rm{D} } /\text{%}}$ ${R_{\rm{N} } /\text{%}}$ ${R_{\rm{T} } /\text{%}}$ ST/s ${R_{\rm{D} } /\text{%}}$ ${R_{\rm{N} } /\text{%}}$ ${R_{\rm{T} } /\text{%}}$ ST /s A 100 100 100 6.64 100 100 100 6.76 100 100 100 7.20 B 100 100 100 4.64 100 100 100 4.88 100 100 100 4.92 C 100 100 100 7.24 100 100 100 7.56 100 98.75 99.38 7.51 D 100 100 100 1.88 100 95.00 97.50 2.14 92.50 100 96.25 2.44