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| Constant-step stress accelerated life test of VFD under Weibull distribution case* |
| ZHANG Jian-ping, GENG Xin-min |
| Department of Information & Electronic Engineering, Zhejiang University, Hangzhou 310027, China; Faculty of Computer and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China |
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Abstract Constant-step stress accelerated life test of Vacuum Fluorescent Display (VFD) was conducted with increased cathode temperature. Statistical analysis was done by applying Weibull distribution for describing the life, and Least Square Method (LSM) for estimating Weibull parameters. Self-designed special software was used to predict the VFD life. Numerical results showed that the average life of VFD is over 30000 h, that the VFD life follows Weibull distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. Accurate calculation of the key parameter enabled rapid estimation of VFD life.
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Received: 18 January 2005
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