Advanced Manufacturing Engineering |
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Inversion of thicknesses of multi-layered structures from eddy current testing measurements |
HUANG Ping-jie, WU Zhao-tong |
Institute of Advanced Manufacturing Engineering, Zhejiang University, Hangzhou 310027, China |
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Abstract Luquire et al.\'s impedance change model of a rectangular cross section probe coil above a structure with an arbitrary number of parallel layers was used to study the principle of measuring thicknesses of multi-layered structures in terms of eddy current testing voltage measurements. An experimental system for multi-layered thickness measurement was developed and several fitting models to formulate the relationships between detected impedance/voltage measurements and thickness are put forward using least square method. The determination of multi-layered thicknesses was investigated after inversing the voltage outputs of the detecting system. The best fitting and inversion models are presented.
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Received: 11 March 2003
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