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Journal of Zhejiang University-SCIENCE A (Applied Physics & Engineering)  2007, Vol. 8 Issue (8): 1340-1345    DOI: 10.1631/jzus.2007.A1340
Information Science     
New finding on out-of-step separation configuration of large-scale power systems
WANG Chao, GAO Peng, ZHANG Xue-song, SHAO Wei
Department of Electrical Engineering, Zhejiang University, Hangzhou 310027, China; NARI Relays Electric Co., Ltd., Nanjing 211100, China; Zhejiang Electrical Power Research and Test Institute, Hangzhou 310014, China; California Independent System Operator, Folsom, CA 95630, USA
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Abstract  In this paper, two new concepts—“main out-of-step mode” and “minor out-of-step mode”—are proposed for power system reliability analysis. Large-scale power system studies found that out-of-step generator groups may have characteristics of the main out-of-step mode and the minor out-of-step mode. The generator groups with main out-of-step modes can determine the out-of-step interface of the large-scale power system, while generators with the minor out-of-step modes cannot play such a role. Therefore, the method of capturing the out-of-step interface by seeking the lowest voltage point (the out-of-step center) can only group the generators with the main out-of-step modes, and may fail to combine the generators with the minor out-of-step modes into proper coherent generator groups. Thus, it is necessary in engineering applications to equip the generators that are likely to have the characteristics of the minor out-of-step modes with separation devices based on off-line simulation studies in order to reduce the risk of further accidents caused by these generators after system separation.

Key wordsOut-of-step center      Out-of-step interface      Separation device      Main out-of-step mode      Minor out-of-step mode     
Received: 09 November 2006     
CLC:  TM732  
Cite this article:

WANG Chao, GAO Peng, ZHANG Xue-song, SHAO Wei. New finding on out-of-step separation configuration of large-scale power systems. Journal of Zhejiang University-SCIENCE A (Applied Physics & Engineering), 2007, 8(8): 1340-1345.

URL:

http://www.zjujournals.com/xueshu/zjus-a/10.1631/jzus.2007.A1340     OR     http://www.zjujournals.com/xueshu/zjus-a/Y2007/V8/I8/1340

[1] JIN Shao-hua, LU Jian-guo, WAN Yan-ping, SUN Shu-guang. Application of the Bayes’ theory to the failure rate evaluation of electrical apparatus[J]. Journal of Zhejiang University-SCIENCE A (Applied Physics & Engineering), 2007, 8(3 ): 29-.