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一种基于参数扰动的芯片成品率双目标优化框架 |
Xin Li, Jin Sun, Fu Xiao, Jiang-shan Tian |
1Technology Innovation Center, Jiangsu Academy of Safety Science and Technology, Nanjing 210042, China; 2Jiangsu High Technology Research Key Laboratory for Wireless Sensor Networks, Nanjing University of Posts and Telecommunications, Nanjing 210013, China; 3School of Computer Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China |
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An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations |
Xin Li, Jin Sun, Fu Xiao, Jiang-shan Tian |
1Technology Innovation Center, Jiangsu Academy of Safety Science and Technology, Nanjing 210042, China; 2Jiangsu High Technology Research Key Laboratory for Wireless Sensor Networks, Nanjing University of Posts and Telecommunications, Nanjing 210013, China; 3School of Computer Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China |
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