基于迁移学习与深度森林的晶圆图缺陷识别
Wafer map defect recognition based on transfer learning and deep forest
基于迁移学习与深度森林的晶圆图缺陷识别 |
| 沈宗礼,余建波 |
|
Wafer map defect recognition based on transfer learning and deep forest |
| Zong-li SHEN,Jian-bo YU |
| 图 8 基于迁移学习的DenseNet169的训练过程 |
| Fig.8 Training process of DenseNet169 based on transfer learning |
|
|