基于迁移学习与深度森林的晶圆图缺陷识别
Wafer map defect recognition based on transfer learning and deep forest
基于迁移学习与深度森林的晶圆图缺陷识别 |
| 沈宗礼,余建波 |
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Wafer map defect recognition based on transfer learning and deep forest |
| Zong-li SHEN,Jian-bo YU |
| 图 4 深度森林网络结构（以400维输入为例） |
| Fig.4 Deep forest network structure（taking 400-dimensional input as example） |
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