基于迁移学习与深度森林的晶圆图缺陷识别
沈宗礼,余建波
Wafer map defect recognition based on transfer learning and deep forest
Zong-li SHEN,Jian-bo YU
图 10
原始数据和DenseNet特征的可视化分析
Fig.10
Visualization analysis of raw data and DenseNet features